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  4. Off-Axis Low Coherence Interferometry for Surface Topology Measurement
 
conference paper

Off-Axis Low Coherence Interferometry for Surface Topology Measurement

Delacrétaz, Yves
•
Boss, Daniel
•
Lang, Florian
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2010
Speckle 2010: Optical Metrology
Speckle 2010

In this communication we introduce a low or reduced coherence interferometry technique that can be used to retrieve surface topology on samples with high roughness. Moreover, we will show that the approach enables surface topology measurement also at the interface of so-called turbid media, where multiple scattering inside tissues can be a major issue, preventing accurate measurements.

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Type
conference paper
DOI
10.1117/12.870742
Web of Science ID

WOS:000287657900041

Author(s)
Delacrétaz, Yves
Boss, Daniel
Lang, Florian
Depeursinge, Christian  
Date Issued

2010

Publisher

Spie-Int Soc Optical Engineering, Po Box 10, Bellingham, Wa 98227-0010 Usa

Published in
Speckle 2010: Optical Metrology
ISBN of the book

978-0-8194-7670-8

Series title/Series vol.

Proceedings of SPIE-The International Society for Optical Engineering; 7387

Start page

738715

Subjects

[MVD]

Editorial or Peer reviewed

NON-REVIEWED

Written at

EPFL

EPFL units
LOA  
Event nameEvent placeEvent date
Speckle 2010

Florianopolis, Brazil

September, 13-15, 2010

Available on Infoscience
November 1, 2010
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/56494
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