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research article

Imaging of GaAs Nanowire Using Combined Aberration-corrected TEM/STEM and Exit Wave Restoration

Chang, L-Y
•
Lazar, S
•
Bártová, B
Show more
2009
Microscopy and Microanalysis
Type
research article
DOI
10.1017/S1431927609096470
Author(s)
Chang, L-Y
Lazar, S
Bártová, B
Botton, Ga
Hébert, C
Fontcuberta i Morral, Anna  
Date Issued

2009

Published in
Microscopy and Microanalysis
Volume

15

Issue

S2

Start page

138

End page

139

Note

National Licences

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LMSC1  
CIME  
Available on Infoscience
August 23, 2019
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/160261