Imaging of GaAs Nanowire Using Combined Aberration-corrected TEM/STEM and Exit Wave Restoration

research article

Imaging of GaAs Nanowire Using Combined Aberration-corrected TEM/STEM and Exit Wave Restoration

Chang, L-Y

•

Lazar, S

•

Bártová, B

2009

Microscopy and Microanalysis

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S1431927609096470.pdf

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Publisher's Version

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http://purl.org/coar/version/c_970fb48d4fbd8a85

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openaccess

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980.89 KB

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Adobe PDF

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