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  4. Imaging of GaAs Nanowire Using Combined Aberration-corrected TEM/STEM and Exit Wave Restoration
 
research article

Imaging of GaAs Nanowire Using Combined Aberration-corrected TEM/STEM and Exit Wave Restoration

Chang, L-Y
•
Lazar, S
•
Bártová, B
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2009
Microscopy and Microanalysis
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S1431927609096470.pdf

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Published version

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openaccess

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980.89 KB

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Adobe PDF

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2476a25a11882ee6674ca60d9a3f0336

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