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Local volume inversion and corner effects in triangular gate-all-around MOSFETs
conference paper
Local volume inversion and corner effects in triangular gate-all-around MOSFETs
Moselund, K. E.
•
Bouvet, D.
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Tschuor, L.
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2006
2006 European Solid-State Device Research Conference
ESSDERC 2006
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