conference paper
Local volume inversion and corner effects in triangular gate-all-around MOSFETs
2006
2006 European Solid-State Device Research Conference
Type
conference paper
Web of Science ID
WOS:000245038000085
Author(s)
Date Issued
2006
Published in
2006 European Solid-State Device Research Conference
Start page
359
End page
362
Editorial or Peer reviewed
REVIEWED
Written at
EPFL
EPFL units
| Event name |
Available on Infoscience
May 16, 2007
Use this identifier to reference this record