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research article

Processing and properties of thin film pyroelectric devices

Kohli, Markus
•
Huang, Yuhong
•
Maeder, Thomas
Show more
1995
Microelectronic Engineering

Pyroelectric PbTiO3 thin films devices with two temperature compensating elements on a SiO2/Si3N4 membranes have been fabricated and characterized. The measured voltage responsivity as a function of radiation modulation frequency has been compared to finite element model calculation. The relevant film properties have been compared for sputter and a sol-gel deposition techniques. The calculated responsivity amounts to 30 V/W. The measured pyroelectric signal is a few mu V.

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Type
research article
DOI
10.1016/0167-9317(95)00122-0
Web of Science ID

WOS:A1995TP60800018

Author(s)
Kohli, Markus
Huang, Yuhong
Maeder, Thomas
Wuethrich, Christian
Bell, Andrew
Muralt, Paul  
Setter, Nava  
Ryser, Peter
Forster, Martin
Date Issued

1995

Publisher

Elsevier

Published in
Microelectronic Engineering
Volume

29

Issue

1-4

Start page

93

End page

96

Note

Kohli, M Ecole Polytech Fed Lausanne,Lab Ceram,Ch-1015 Lausanne,Switzerland, Tp608, Times Cited:21, Cited References Count:7

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LC  
Available on Infoscience
August 21, 2006
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/233266
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