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conference paper
Charge-based modeling of field effect transistors, Make it easy
January 1, 2021
2021 Joint International Eurosoi Workshop And International Conference On Ultimate Integration On Silicon (Eurosoi-Ulis)
In this presentation, we revisit some charge-voltage dependences for different architectures of field effect transistor, emphasizing on compactness and simplicity while maintaining a close link with physics, which makes these models predictive and accurate for general purposes of compact modeling.
Type
conference paper
Web of Science ID
WOS:000790181800030
Authors
Publication date
2021-01-01
Publisher
Published in
2021 Joint International Eurosoi Workshop And International Conference On Ultimate Integration On Silicon (Eurosoi-Ulis)
ISBN of the book
978-1-6654-3745-5
Publisher place
New York
Series title/Series vol.
International Conference on Ultimate Integration on Silicon
Peer reviewed
REVIEWED
EPFL units
Event name | Event place | Event date |
Caen, FRANCE | Sep 01-03, 2021 | |
Available on Infoscience
May 23, 2022
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