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  4. Charge-based modeling of field effect transistors, Make it easy
 
conference paper

Charge-based modeling of field effect transistors, Make it easy

Sallese, Jean-Michel  
January 1, 2021
2021 Joint International Eurosoi Workshop And International Conference On Ultimate Integration On Silicon (Eurosoi-Ulis)
Joint International EUROSOI Workshop / International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS)

In this presentation, we revisit some charge-voltage dependences for different architectures of field effect transistor, emphasizing on compactness and simplicity while maintaining a close link with physics, which makes these models predictive and accurate for general purposes of compact modeling.

  • Details
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Type
conference paper
DOI
10.1109/EuroSOI-ULIS53016.2021.9560680
Web of Science ID

WOS:000790181800030

Author(s)
Sallese, Jean-Michel  
Date Issued

2021-01-01

Publisher

IEEE

Publisher place

New York

Published in
2021 Joint International Eurosoi Workshop And International Conference On Ultimate Integration On Silicon (Eurosoi-Ulis)
ISBN of the book

978-1-6654-3745-5

Series title/Series vol.

International Conference on Ultimate Integration on Silicon

Subjects

Engineering, Electrical & Electronic

•

Physics, Applied

•

Engineering

•

Physics

•

compact model

•

mosfet

•

jfet

•

junctionless

•

hemt

•

nanowire

•

double gate

•

ekv

•

gate

•

operation

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
GR-SCI-IEL  
Event nameEvent placeEvent date
Joint International EUROSOI Workshop / International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS)

Caen, FRANCE

Sep 01-03, 2021

Available on Infoscience
May 23, 2022
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/187960
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