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conference paper

Charge-based modeling of field effect transistors, Make it easy

Sallese, Jean-Michel  
January 1, 2021
2021 Joint International Eurosoi Workshop And International Conference On Ultimate Integration On Silicon (Eurosoi-Ulis)
Joint International EUROSOI Workshop / International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS)

In this presentation, we revisit some charge-voltage dependences for different architectures of field effect transistor, emphasizing on compactness and simplicity while maintaining a close link with physics, which makes these models predictive and accurate for general purposes of compact modeling.

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