conference paper
Charge-based modeling of field effect transistors, Make it easy
January 1, 2021
2021 Joint International Eurosoi Workshop And International Conference On Ultimate Integration On Silicon (Eurosoi-Ulis)
In this presentation, we revisit some charge-voltage dependences for different architectures of field effect transistor, emphasizing on compactness and simplicity while maintaining a close link with physics, which makes these models predictive and accurate for general purposes of compact modeling.