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research article
Combining in-Situ SEM with High Sensitivity Analytical TEM for Understanding the Degradation of Metallic Interconnects in SOFC
August 4, 2017
Type
research article
Authors
Publication date
2017-08-04
Published in
Volume
23
Issue
S1
Start page
2060
End page
2061
Peer reviewed
REVIEWED
EPFL units
Available on Infoscience
November 19, 2020
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