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research article
Composition Metrology of Ternary Semiconductor Alloys Analyzed by Atom Probe Tomography
Use this identifier to reference this record
Type
research article
Web of Science ID
WOS:000440520500027
Authors
Di Russo, E
•
Moyon, F
•
Gogneau, N
•
Largeau, L
•
Giraud, E
•
Carlin, JF
•
Grandjean, N
•
Chauveau, JM
•
Hugues, M
•
Blum, I
Publication date
2018
Published in
Volume
122
Issue
29
Start page
16704
End page
16714
Peer reviewed
REVIEWED
EPFL units
Available on Infoscience
November 8, 2018