research article
Composition Metrology of Ternary Semiconductor Alloys Analyzed by Atom Probe Tomography
Cite this item
Di Russo, E., Moyon, F., Gogneau, N., Largeau, L., Giraud, E., Carlin, J., Grandjean, N., Chauveau, J., Hugues, M., Blum, I., Lefebvre, W., Vurpillot, F., Blavette, D., & Rigutti, L. (2018). Composition Metrology of Ternary Semiconductor Alloys Analyzed by Atom Probe Tomography. Journal of Physical Chemistry C, 122(29), 16704–16714. https://doi.org/10.1021/acs.jpcc.8b03223
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Type
research article
Web of Science ID
WOS:000440520500027
Author(s)
Di Russo, E
Moyon, F
Gogneau, N
Largeau, L
Giraud, E
Carlin, JF
Grandjean, N
Chauveau, JM
Hugues, M
Blum, I
Date Issued
2018
Published in
Volume
122
Issue
29
Start page
16704
End page
16714
Editorial or Peer reviewed
REVIEWED
Written at
EPFL
EPFL units
Available on Infoscience
November 8, 2018
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