EKV3 Parameter Extraction and Characterization of 90nm RF-CMOS Technology
2007
Details
Title
EKV3 Parameter Extraction and Characterization of 90nm RF-CMOS Technology
Author(s)
Yoshitomi, S. ; Bazigos, A. ; Bucher, M.
Published in
2007 14th International Conference on Mixed Design of Integrated Circuits and Systems
Pages
74-79
Conference
2007 14th International Conference on Mixed Design of Integrated Circuits and Systems, Ciechocinek, Poland, 21-23 06 2007
Date
2007
Publisher
IEEE
Laboratories
IEL
Record Appears in
Scientific production and competences > STI - School of Engineering > STI Archives > IEL - Institute of Electrical Engineering
Peer-reviewed publications
Work outside EPFL
Conference Papers
Published
Peer-reviewed publications
Work outside EPFL
Conference Papers
Published
Record creation date
2011-01-05