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1.	An adaptive phase field approach to 3D internal crack growth in rocks Xu, Bin ; Xu, Tao ; Heap, Michael J. ; Kushnir, Alexandra[...] Computers and Geotechnics, 173, 106551 (2024) 2024 \| Journal Articles \| Detailed record - Similar records
2.	Analogies and differences between the stability of an isolated pancake vortex and a columnar vortex in stratified fluid Yim, Eunok ; Billant, Paul Journal of Fluid Mechanics, 796, 732-766 (2016) 2016 \| Journal Articles \| Detailed record - Similar records
3.	Transition to turbulence in the rotating disk boundary layer of a rotor–stator cavity Yim, Eunok ; Chomaz, J.-M. ; Martinand, D. ; Serre, E. Journal of Fluid Mechanics, 848, 631-647 (2018) 2018 \| Journal Articles \| Detailed record - Similar records
4.	Stability Criterion for the Centrifugal Instability of Surface Intensified Anticyclones Yim, Eunok ; Stegner, Alexandre ; Billant, Paul Journal of Physical Oceanography, 49 (3), 827-849 (2019) 2019 \| Journal Articles \| Detailed record - Similar records
5.	On the mechanism of the Gent–McWilliams instability of a columnar vortex in stratified rotating fluids Yim, Eunok ; Billant, Paul Journal of Fluid Mechanics, 780, 5-44 (2015) 2015 \| Journal Articles \| Detailed record - Similar records
6.	Stability of an isolated pancake vortex in continuously stratified-rotating fluids Yim, Eunok ; Billant, Paul ; Ménesguen, Claire Journal of Fluid Mechanics, 801, 508-553 (2016) 2016 \| Journal Articles \| Detailed record - Similar records
7.	PDF s40194-024-01789-3 Local relaxation of residual stress in high-strength steel welded joints treated by HFMI Ono, Yuki ; Remes, Heikki ; Kinoshita, Koji ; Yıldırım, Halid Can[...] Welding in the World (2024) 2024 \| Journal Articles \| Detailed record - Similar records
8.	Atomic force microscope topographical artifacts after the dielectric breakdown of ultrathin SiO2 films Porti, M. ; Nafrı́a, M. ; Blüm, M.C. ; Aymerich, X.[...] Surface Science, 532-535, 727-731 (2003) 2003 \| Journal Articles \| Detailed record - Similar records
9.	Breakdown-induced negative charge in ultrathin SiO2 films measured by atomic force microscopy Porti, M. ; Nafrı́a, M. ; Blüm, M. C. ; Aymerich, X.[...] Applied Physics Letters, 81 (19), 3615-3617 (2002) 2002 \| Journal Articles \| Detailed record - Similar records
10.	Imaging breakdown spots in SiO2 films and MOS devices with a conductive atomic force microscope Porti, M. ; Blum, M.-C. ; Nafria, M. ; Aymerich, X. IEEE Transactions on Device and Materials Reliability, 2 (4), 94-101 (2002) 2002 \| Journal Articles \| Detailed record - Similar records

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