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conference paper
Off-Axis Low Coherence Interferometry for Surface Topology Measurement
2010
Speckle 2010: Optical Metrology
In this communication we introduce a low or reduced coherence interferometry technique that can be used to retrieve surface topology on samples with high roughness. Moreover, we will show that the approach enables surface topology measurement also at the interface of so-called turbid media, where multiple scattering inside tissues can be a major issue, preventing accurate measurements.
Type
conference paper
Web of Science ID
WOS:000287657900041
Authors
Publication date
2010
Published in
Speckle 2010: Optical Metrology
ISBN of the book
978-0-8194-7670-8
Series title/Series vol.
Proceedings of SPIE-The International Society for Optical Engineering; 7387
Start page
738715
Subjects
Peer reviewed
NON-REVIEWED
EPFL units
Event name | Event place | Event date |
Florianopolis, Brazil | September, 13-15, 2010 | |
Available on Infoscience
November 1, 2010
Use this identifier to reference this record