Off-Axis Low Coherence Interferometry for Surface Topology Measurement

In this communication we introduce a low or reduced coherence interferometry technique that can be used to retrieve surface topology on samples with high roughness. Moreover, we will show that the approach enables surface topology measurement also at the interface of so-called turbid media, where multiple scattering inside tissues can be a major issue, preventing accurate measurements.


Published in:
Speckle 2010: Optical Metrology, 7387, -
Presented at:
Speckle 2010, Florianopolis, Brazil, September, 13-15, 2010
Year:
2010
Publisher:
Spie-Int Soc Optical Engineering, Po Box 10, Bellingham, Wa 98227-0010 Usa
ISBN:
978-0-8194-7670-8
Keywords:
Laboratories:




 Record created 2010-11-01, last modified 2018-01-28


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