Characterization and fabrication of fully metal coated Scanning Near-Field Optical Microscopy SiO2 tips
2003
Details
Title
Characterization and fabrication of fully metal coated Scanning Near-Field Optical Microscopy SiO2 tips
Author(s)
Aeschimann, L. ; Akiyama, T. ; Eckert, R. ; Heinzelmann, H. ; Staufer, U. ; de Rooij, N. F.
Published in
Journal of Microscopy
Volume
209
Issue
3
Pages
182-187
Conference
NF07, The 7th International Conference on Near-field Optics and Related Techniques, University of Rochester, U.S.A., 11–15 August 2002
Date
2003
Laboratories
SAMLAB
Record Appears in
Scientific production and competences > STI - School of Engineering > STI Archives > SAMLAB - Sensors, Actuators and Microsystems Laboratory
Work outside EPFL
Conference Papers
Published
Work outside EPFL
Conference Papers
Published
Record creation date
2009-05-12