Theoretical and experimental characterization of fully metal coated scanning near-field optical microscopy SiO2 Tips


Published in:
2002 IEEE/LEOS International Conference on Optical MEMs, 7-8
Year:
2002
Publisher:
IEEE Lasers and Electro-Optics Society, Piscataway, NJ, USA
Laboratories:




 Record created 2009-04-22, last modified 2018-03-17


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