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conference paper
Theoretical and experimental characterization of fully metal coated scanning near-field optical microscopy SiO2 Tips
2002
2002 IEEE/LEOS International Conference on Optical MEMs
Type
conference paper
Authors
Vaccaro, L.
•
Aeschlimann, L.
•
Akiyama, T.
•
Eckert, R.
•
Heinzelmann, H.
•
•
Stauffer, U.
•
Publication date
2002
Published in
2002 IEEE/LEOS International Conference on Optical MEMs
Publisher place
Piscataway, NJ, USA
Start page
7
End page
8
EPFL units
Available on Infoscience
April 22, 2009
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