Optical Reflectometry with Micrometer Resolution for the Investigation of Integrated Optical-Devices
1989
Details
Title
Optical Reflectometry with Micrometer Resolution for the Investigation of Integrated Optical-Devices
Author(s)
Beaud, P. ; Schutz, J. ; Hodel, W. ; Weber, H. P. ; Gilgen, H. H. ; Salathe, R. P.
Published in
Ieee Journal of Quantum Electronics
Volume
25
Issue
4
Pages
755-759
Date
1989
Laboratories
LOA
Record Appears in
Scientific production and competences > STI - School of Engineering > STI Archives > LOA - Advanced Photonics Laboratory
Peer-reviewed publications
Work outside EPFL
Journal Articles
Published
Peer-reviewed publications
Work outside EPFL
Journal Articles
Published
Record creation date
2009-01-20