research article
Elastic deformations of tip and sample during atomic force microscope measurements
Cite this item
Heuberger, M., Dietler, G., & Schlapbach, L. (1996). Elastic deformations of tip and sample during atomic force microscope measurements. Journal of Vacuum Science & Technology B (1992-2009), 14(2), 1250–1254. https://doi.org/10.1116/1.588525
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Type
research article
Author(s)
Date Issued
1996
Publisher
Published in
Volume
14
Issue
2
Start page
1250
End page
1254
Editorial or Peer reviewed
REVIEWED
Written at
EPFL
EPFL units
Available on Infoscience
June 20, 2007
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