research article
Quantitative (200) dark-field imaging of InGaAs/GaAs layers : measurement of chemical composition and strain effects
Type
research article
Web of Science ID
WOS:000176465200008
Author(s)
Date Issued
2001
Published in
Volume
169
Start page
37
End page
40
Editorial or Peer reviewed
REVIEWED
Written at
EPFL
EPFL units
Available on Infoscience
February 15, 2007
Use this identifier to reference this record