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research article
Quantitative (200) dark-field imaging of InGaAs/GaAs layers : measurement of chemical composition and strain effects
Type
research article
Web of Science ID
WOS:000176465200008
Authors
Publication date
2001
Published in
Volume
169
Start page
37
End page
40
Peer reviewed
REVIEWED
EPFL units
Available on Infoscience
February 15, 2007
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