conference paper
Theoretical and experimental characterization of fully metal coated scanning near-field optical microscopy SiO2 Tips
2002
2002 IEEE/LEOS International Conference on Optical MEMs
Type
conference paper
Author(s)
Vaccaro, L.
Aeschlimann, L.
Akiyama, T.
Eckert, R.
Heinzelmann, H.
Stauffer, U.
Date Issued
2002
Publisher place
Piscataway, NJ, USA
Published in
2002 IEEE/LEOS International Conference on Optical MEMs
Start page
7
End page
8
Written at
OTHER
EPFL units
Available on Infoscience
April 22, 2009
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