Components for high-speed atomic force microscopy optimized for low phase-lag

Nievergelt, Adrian P; Andany, Santiago H; Adams, Jonathan D; Hannebelle, Melanie Tm; Fantner, Georg E

doi:10.1109/AIM.2017.8014104

conference paper

Components for high-speed atomic force microscopy optimized for low phase-lag

Nievergelt, Adrian P

•

Andany, Santiago H

•

Adams, Jonathan D

2017

2017 IEEE International Conference on Advanced Intelligent Mechatronics (AIM)

Cite this item

Nievergelt, A. P., Andany, S. H., Adams, J. D., Hannebelle, M. T., & Fantner, G. E. (2017). Components for high-speed atomic force microscopy optimized for low phase-lag. 2017 IEEE International Conference on Advanced Intelligent Mechatronics (AIM), 731–736. https://doi.org/10.1109/AIM.2017.8014104

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