conference paper
Components for high-speed atomic force microscopy optimized for low phase-lag
2017
2017 IEEE International Conference on Advanced Intelligent Mechatronics (AIM)
Type
conference paper
Author(s)
Date Issued
2017
Publisher
Published in
2017 IEEE International Conference on Advanced Intelligent Mechatronics (AIM)
Start page
731
End page
736
Editorial or Peer reviewed
REVIEWED
Written at
EPFL
EPFL units
| Event name | Event place | Event date |
Munich, Germany | 3-7 July 2017 | |
Use this identifier to reference this record