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research article

Extended focus depth for Fourier domain optical coherence microscopy

Leitgeb, R. A.
•
Villiger, M.  
•
Bachmann, A. H.
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2006
Optics Letters

We report on a new detection scheme for Fourier domain optical coherence microscopy that exhibits high transverse resolution along an axially extended focal range. Nearly constant transverse resolution of ∼1.5 μm along a focal range of 200 μm is experimentally verified with a maximum sensitivity of 105 dB. A broad-bandwidth Ti:sapphire laser allowed for an axial resolution of 3 μm in air.

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