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research article

Extended focus depth for Fourier domain optical coherence microscopy

Leitgeb, R. A.
•
Villiger, M.  
•
Bachmann, A. H.
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2006
Optics Letters

We report on a new detection scheme for Fourier domain optical coherence microscopy that exhibits high transverse resolution along an axially extended focal range. Nearly constant transverse resolution of ∼1.5 μm along a focal range of 200 μm is experimentally verified with a maximum sensitivity of 105 dB. A broad-bandwidth Ti:sapphire laser allowed for an axial resolution of 3 μm in air.

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Type
research article
DOI
10.1364/OL.31.002450
Web of Science ID

WOS:000240008400024

Author(s)
Leitgeb, R. A.
Villiger, M.  
Bachmann, A. H.
Steinmann, L.  
Lasser, T.  
Date Issued

2006

Published in
Optics Letters
Volume

31

Issue

16

Start page

2450

End page

2452

Subjects

(110.4500) Imaging systems

•

Optical coherence tomography

•

(170.3880) Medical optics and biotechnology

•

Medical and biological imaging

•

(170.6900) Medical optics and biotechnology

•

Three-dimensional microscopy

Editorial or Peer reviewed

REVIEWED

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https://infoscience.epfl.ch/handle/20.500.14299/18986
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