research article
Extended focus depth for Fourier domain optical coherence microscopy
2006
We report on a new detection scheme for Fourier domain optical coherence microscopy that exhibits high transverse resolution along an axially extended focal range. Nearly constant transverse resolution of ∼1.5 μm along a focal range of 200 μm is experimentally verified with a maximum sensitivity of 105 dB. A broad-bandwidth Ti:sapphire laser allowed for an axial resolution of 3 μm in air.
Type
research article
Web of Science ID
WOS:000240008400024
Author(s)
Date Issued
2006
Published in
Volume
31
Issue
16
Start page
2450
End page
2452
Editorial or Peer reviewed
REVIEWED
Written at
EPFL
EPFL units
Use this identifier to reference this record