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Plessky, V., Kucuk, S., Zhang, N., & Villanueva, L. G. (2025, September 15). Tri-layered XBAR with SiO2 middle layer. 2025 IEEE International Ultrasonics Symposium (IUS). 2025 IEEE International Ultrasonics Symposium, Utrecht, Netherlands, September 15, 2025. https://doi.org/10.1109/ius62464.2025.11201589

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