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  4. Digital Holographic Microscopy (DHM) applied to optical metrology: A resolution enhanced imaging technology applied to inspection of microscopic devices with subwavelength resolution
 
conference paper

Digital Holographic Microscopy (DHM) applied to optical metrology: A resolution enhanced imaging technology applied to inspection of microscopic devices with subwavelength resolution

Depeursinge, C. D.  
•
Marian, A. M.
•
Montfort, F.  
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2006
Fringe 2005
The 5th International Workshop on Automatic Processing of Finge Patterns
  • Details
  • Metrics
Type
conference paper
DOI
10.1007/3-540-29303-5_41
Web of Science ID

WOS:000233295500041

Author(s)
Depeursinge, C. D.  
Marian, A. M.
Montfort, F.  
Colomb, T.  
Charriere, F.  
Kuhn, J.
Date Issued

2006

Publisher

Springer-Verlag

Publisher place

Berlin

Published in
Fringe 2005
ISBN of the book

3-540-26037-4

Start page

308

End page

314

Subjects

[MVD]

•

CONTRAST

Editorial or Peer reviewed

NON-REVIEWED

Written at

EPFL

EPFL units
LOA  
Event nameEvent placeEvent date
The 5th International Workshop on Automatic Processing of Finge Patterns

Stuttgart

November 28-2, 2005

Available on Infoscience
July 20, 2009
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/41613
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