research article
Combining in-Situ SEM with High Sensitivity Analytical TEM for Understanding the Degradation of Metallic Interconnects in SOFC
August 4, 2017
Type
research article
Author(s)
Date Issued
2017-08-04
Published in
Volume
23
Issue
S1
Start page
2060
End page
2061
Editorial or Peer reviewed
REVIEWED
Written at
EPFL
EPFL units
Available on Infoscience
November 19, 2020
Use this identifier to reference this record