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research article

On-Chip Self-Calibrating Communication Techniques Robust to Electrical Parameter Variations

Worm, Frédéric  
•
Ienne, Paolo  
•
Thiran, Patrick  
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2004
IEEE Design and Test of Computers
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WormNov04_OnChipSelfCalibratingCommunicationTechniquesRobustToElectricalParameterVariations_IEEEDTC.pdf

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172 KB

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Adobe PDF

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850913d2a2ac1d0f5af4b8ad7f1798ae

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