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research article

On-Chip Self-Calibrating Communication Techniques Robust to Electrical Parameter Variations

Worm, Frédéric  
•
Ienne, Paolo  
•
Thiran, Patrick  
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2004
IEEE Design and Test of Computers
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Type
research article
DOI
10.1109/MDT.2004.96
Web of Science ID

WOS:000225077200008

Author(s)
Worm, Frédéric  
Ienne, Paolo  
Thiran, Patrick  
De Micheli, Giovanni  
Date Issued

2004

Published in
IEEE Design and Test of Computers
Volume

21

Issue

6

Start page

524

End page

35

Subjects

Robust Design

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LAP  
LSI1  
Available on Infoscience
August 8, 2005
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/215198
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