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  4. Centralized Short-Circuit Protection of SiC Modules Connected in Parallel
 
conference paper

Centralized Short-Circuit Protection of SiC Modules Connected in Parallel

Li, Chengmin
•
Dujic, Drazen  
October 2024
2024 IEEE Energy Conversion Congress and Exposition, ECCE 2024 - Proceedings
2024 IEEE Energy Conversion Congress and Exposition (ECCE)

Due to the low short circuit withstanding time, short-circuit protection (SCP) for SiC devices is challenging. The SCP is more difficult when multiple devices are connected in parallel, as the turn-off of one device locally may lead to the overstressing of others. To resolve this, a centralized SCP approach designed for parallel-connected devices is introduced. This method employs the instantaneous current from the common-source inductors in power modules as a key metric to simultaneously reduce the gate-source voltages across all devices. Additionally, the voltage drop across each power device is monitored to enable their timely turn-off. This two-stage strategy ensures a quick response and high noise immunity for SiC devices. The proposed approach, seamlessly integrated with the power converter's controller, has been experimentally validated in a three-phase converter.

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Type
conference paper
DOI
10.1109/ECCE55643.2024.10861119
Scopus ID

2-s2.0-86000458048

Author(s)
Li, Chengmin

Technische Universiteit Eindhoven

Dujic, Drazen  

EPFL

Date Issued

2024-10

Publisher

Institute of Electrical and Electronics Engineers Inc.

Published in
2024 IEEE Energy Conversion Congress and Exposition, ECCE 2024 - Proceedings
DOI of the book
https://doi.org/10.1109/ECCE55643.2024
ISBN of the book

9798350376067

Start page

6827

End page

6834

Subjects

gate driver

•

short circuit protection

•

SiC MOSFETs

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
PEL  
Event nameEvent acronymEvent placeEvent date
2024 IEEE Energy Conversion Congress and Exposition (ECCE)

ECCE 2024

Phoenix, AZ, USA

2024-10-20 - 2024-10-24

Available on Infoscience
March 25, 2025
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/248231
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