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conference paper

Centralized Short-Circuit Protection of SiC Modules Connected in Parallel

Li, Chengmin
•
Dujic, Drazen  
October 2024
2024 IEEE Energy Conversion Congress and Exposition, ECCE 2024 - Proceedings
2024 IEEE Energy Conversion Congress and Exposition (ECCE)

Due to the low short circuit withstanding time, short-circuit protection (SCP) for SiC devices is challenging. The SCP is more difficult when multiple devices are connected in parallel, as the turn-off of one device locally may lead to the overstressing of others. To resolve this, a centralized SCP approach designed for parallel-connected devices is introduced. This method employs the instantaneous current from the common-source inductors in power modules as a key metric to simultaneously reduce the gate-source voltages across all devices. Additionally, the voltage drop across each power device is monitored to enable their timely turn-off. This two-stage strategy ensures a quick response and high noise immunity for SiC devices. The proposed approach, seamlessly integrated with the power converter's controller, has been experimentally validated in a three-phase converter.

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Type
conference paper
DOI
10.1109/ECCE55643.2024.10861119
Scopus ID

2-s2.0-86000458048

Author(s)
Li, Chengmin
•
Dujic, Drazen  
Date Issued

2024-10

Publisher

Institute of Electrical and Electronics Engineers Inc.

Published in
2024 IEEE Energy Conversion Congress and Exposition, ECCE 2024 - Proceedings
DOI of the book
https://doi.org/10.1109/ECCE55643.2024
ISBN of the book

9798350376067

Start page

6827

End page

6834

Subjects

gate driver

•

short circuit protection

•

SiC MOSFETs

Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
PEL  
Event nameEvent acronymEvent placeEvent date
2024 IEEE Energy Conversion Congress and Exposition (ECCE)

ECCE 2024

Phoenix, AZ, USA

2024-10-20 - 2024-10-24

Available on Infoscience
March 25, 2025
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/248231
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