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  4. Elastic deformations of tip and sample during atomic force microscope measurements
 
research article

Elastic deformations of tip and sample during atomic force microscope measurements

Heuberger, M.
•
Dietler, G.  
•
Schlapbach, L.
1996
Journal of Vacuum Science & Technology B
  • Details
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Type
research article
DOI
10.1116/1.588525
Author(s)
Heuberger, M.
Dietler, G.  
Schlapbach, L.
Date Issued

1996

Published in
Journal of Vacuum Science & Technology B
Volume

14

Issue

2

Start page

1250

End page

1254

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LPMV  
Available on Infoscience
June 20, 2007
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/9045
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