Repository logo

Infoscience

  • English
  • French
Log In
Logo EPFL, École polytechnique fédérale de Lausanne

Infoscience

  • English
  • French
Log In
  1. Home
  2. Academic and Research Output
  3. Conferences, Workshops, Symposiums, and Seminars
  4. Measurements of light fields emerging from fine amplitude gratings
 
conference paper

Measurements of light fields emerging from fine amplitude gratings

Kim, M.-S.  
•
Scharf, Toralf  
•
Herzig, Hans Peter  
2010
2010 International Conference on Optical MEMS and Nanophotonics
Optical MEMS and Nanophotonics

High resolution amplitude and phase of light fields emerging from a 2-μm-period amplitude grating are measured for different wavelengths. The amplitude gratings lead to highly periodic patterns caused by the Talbot effect. Such patterns reach periodicities of a fraction of the grating period. We discuss the effect of wavelengths and the number of diffraction orders participating in the imaging.

  • Files
  • Details
  • Metrics
Loading...
Thumbnail Image
Name

MEASUREMENTS OF LIGHT FIELDS EMERGING FROM FINE AMPLITUDE GRATINGS_2010.pdf

Access type

openaccess

Size

1.13 MB

Format

Adobe PDF

Checksum (MD5)

3bbe134a3821066e2e42a3ee3c98acf2

Logo EPFL, École polytechnique fédérale de Lausanne
  • Contact
  • infoscience@epfl.ch

  • Follow us on Facebook
  • Follow us on Instagram
  • Follow us on LinkedIn
  • Follow us on X
  • Follow us on Youtube
AccessibilityLegal noticePrivacy policyCookie settingsEnd User AgreementGet helpFeedback

Infoscience is a service managed and provided by the Library and IT Services of EPFL. © EPFL, tous droits réservés