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  4. Measurements of light fields emerging from fine amplitude gratings
 
conference paper

Measurements of light fields emerging from fine amplitude gratings

Kim, M.-S.  
•
Scharf, Toralf  
•
Herzig, Hans Peter  
2010
2010 International Conference on Optical MEMS and Nanophotonics
Optical MEMS and Nanophotonics

High resolution amplitude and phase of light fields emerging from a 2-μm-period amplitude grating are measured for different wavelengths. The amplitude gratings lead to highly periodic patterns caused by the Talbot effect. Such patterns reach periodicities of a fraction of the grating period. We discuss the effect of wavelengths and the number of diffraction orders participating in the imaging.

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Type
conference paper
DOI
10.1109/OMEMS.2010.5672135
Author(s)
Kim, M.-S.  
Scharf, Toralf  
Herzig, Hans Peter  
Date Issued

2010

Published in
2010 International Conference on Optical MEMS and Nanophotonics
Start page

161

End page

162

Subjects

Gratings

•

Measurement

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
OPT  
Event nameEvent placeEvent date
Optical MEMS and Nanophotonics

Sapporo, Japan

August 9 - 12, 2010

Available on Infoscience
September 27, 2010
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/54243
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