conference paper
Measurements of light fields emerging from fine amplitude gratings
2010
2010 International Conference on Optical MEMS and Nanophotonics
High resolution amplitude and phase of light fields emerging from a 2-μm-period amplitude grating are measured for different wavelengths. The amplitude gratings lead to highly periodic patterns caused by the Talbot effect. Such patterns reach periodicities of a fraction of the grating period. We discuss the effect of wavelengths and the number of diffraction orders participating in the imaging.
Type
conference paper
Author(s)
Date Issued
2010
Published in
2010 International Conference on Optical MEMS and Nanophotonics
Start page
161
End page
162
Subjects
Editorial or Peer reviewed
REVIEWED
Written at
EPFL
EPFL units
Event name | Event place | Event date |
Sapporo, Japan | August 9 - 12, 2010 | |
Available on Infoscience
September 27, 2010
Use this identifier to reference this record