Veerappan, C., Richardson, J., Walker, R., Li, D. U., Fishburn, M. W., Stoppa, D., Borghetti, F., Maruyama, Y., Gersbach, M., Henderson, R. K., Bruschini, C., & Charbon, E. (2011). Characterization of Large-Scale Non-Uniformities in a 20k TDC/SPAD Array Integrated in a 130nm CMOS Process. Proc. IEEE European Solid-State Electron Device Conference (ESSDERC), 331–334. https://doi.org/10.1109/essderc.2011.6044167