conference paper
Characterization of Large-Scale Non-Uniformities in a 20k TDC/SPAD Array Integrated in a 130nm CMOS Process
2011
Proc. IEEE European Solid-State Electron Device Conference (ESSDERC)
Type
conference paper
Author(s)
Veerappan, C.
Richardson, J.
Walker, R.
Li, D. U.
Fishburn, M. W.
Stoppa, D.
Borghetti, F.
Henderson, R. K.
Date Issued
2011
Published in
Proc. IEEE European Solid-State Electron Device Conference (ESSDERC)
Start page
331
End page
334
Editorial or Peer reviewed
REVIEWED
Written at
OTHER
EPFL units
| Event name | Event date |
September, 2011 | |
Available on Infoscience
June 12, 2012
Use this identifier to reference this record