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conference paper
Low temperature single electron characteristics in gate-all-around MOSFET
2006
Proceedings of the 36th European Solid-State Devices Research Conference, ESSDERC 2006
Type
conference paper
Web of Science ID
WOS:000245038000102
Authors
Publication date
2006
Published in
Proceedings of the 36th European Solid-State Devices Research Conference, ESSDERC 2006
Start page
427
End page
430
Peer reviewed
REVIEWED
EPFL units
Available on Infoscience
May 16, 2007
Use this identifier to reference this record