High resolution photodetachment spectroscopy of negative ions via slow photoelectron imaging
A technique for high resoln. anion photodetachment spectroscopy is presented that combines velocity map imaging and anion threshold photodetachment. This method, slow electron velocity-map imaging, provides spectral line widths of better than 1 meV. Spectra over a substantial range of electron kinetic energies are recorded in a single image, providing a dramatic redn. of data acquisition time compared to other techniques with comparable resoln. We apply this technique to at. iodine and the van der Waals cluster I.CO2 as test systems, and then to the pre-reactive Cl.D2 complex where partially resolved structure assigned to hindered rotor motion is obsd. [on SciFinder (R)]
Cite this item
Osterwalder, A., Nee, M. J., Zhou, J., & Neumark, D. M. (2004). High resolution photodetachment spectroscopy of negative ions via slow photoelectron imaging. Journal of Chemical Physics, 121(13), 6317–6322. https://doi.org/10.1063/1.1787491
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2004
121
13
6317
6322
CAN 141:429115
73-6
Optical, Electron, and Mass Spectroscopy and Other Related Properties
Department of Chemistry,University of California,Berkeley,CA,USA.
Journal
written in English.
146301-28-2; 405158-41-0 Role: CPS (Chemical process), PEP (Physical, engineering or chemical process), PRP (Properties), PROC (Process) (high resoln. photodetachment spectroscopy of neg. ions via slow photoelectron imaging demonstrated for); 149061-47-2; 405158-41-0D Role: FMU (Formation, unclassified), PRP (Properties), FORM (Formation, nonpreparative) (high resoln. photodetachment spectroscopy of neg. ions via slow photoelectron imaging demonstrated for); 20461-54-5 (Iodine(1-) Role: PRP (Properties) (high resoln. photodetachment spectroscopy of neg. ions via slow photoelectron imaging demonstrated for)
REVIEWED
EPFL