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  4. Depth-of-field extension and 3D reconstruction in digital holographic microscopy
 
conference paper

Depth-of-field extension and 3D reconstruction in digital holographic microscopy

Bergoënd, Isabelle
•
Colomb, Tristan  
•
Pavillon, Nicolas  
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2009
Modeling Aspects in Optical Metrology II
Europe Optical Metrology

The limited depth-of-field is a main drawback of microscopy that prevents from observing, for example, thick semi-transparent objects with all their features in focus. Several algorithms have been developed during the past years to fuse images having various planes of focus and thus obtain a completely focused image with virtually extended depth-of-field. We present a comparison of several of these methods in the particular field of digital holographic microscopy, taking advantage of some of the main properties of holography. We especially study the extended depth-of-field for phase images reconstructed from the hologram of a biological specimen. A criterion of spatial measurement on the object is considered, completed with a visual criterion. The step of distance taken into account to build the stack of images is less than the instrument depth-of-field. Then, preserving the distance of focus associated with each pixel of the image, a three-dimensional representation is presented after automatic detection of the object. The limits of such a method of extraction of 3D information are discussed.

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Type
conference paper
DOI
10.1117/12.827350
Web of Science ID

WOS:000285571900047

Author(s)
Bergoënd, Isabelle
Colomb, Tristan  
Pavillon, Nicolas  
Emery, Yves
Depeursinge, Christian  
Date Issued

2009

Publisher

SPIE

Published in
Modeling Aspects in Optical Metrology II
Volume

7390

Subjects

[MVD]

URL

URL

http://spie.org/x648.html?product_id=827350
Editorial or Peer reviewed

NON-REVIEWED

Written at

EPFL

EPFL units
LOA  
Event nameEvent placeEvent date
Europe Optical Metrology

Munich

June 14-18, 2009

Available on Infoscience
August 2, 2009
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/41959
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