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research article

Piezoresponse force microscopy on doubly clamped KNbO3 nanowires

Wang, J.
•
Stampfer, C.
•
Roman, C.
Show more
2008
Applied Physics Letters

We present piezoresponse force microscopy measurements on individual integrated potassium niobate (KNbO3) nanowires. The devices consist of KNbO3 nanowires on SiO2 substrates being mechanically clamped and electrically biased by lithographically defined metal electrodes. This configuration allows to apply electrical fields parallel to the nanowire axis. Measured piezoelectric displacements reveal a multidomain structure of the nanowire. We observed displacements in the range of 3-13 pm on different domains under V-ac of 2 V, that have typical section length of approximate to 200 nm, along a doubly clamped nanowire with approximate to 100 nm diameter. A maximum nominal piezoelectric coefficient of 7.9 pm/V has been extracted.

  • Details
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Type
research article
DOI
10.1063/1.3000385
Web of Science ID

WOS:000261430600059

Author(s)
Wang, J.
Stampfer, C.
Roman, C.
Ma, W.H.
Setter, N.  
Hierold, C.
Date Issued

2008

Publisher

AIP American Institute of Physics

Published in
Applied Physics Letters
Volume

93

Issue

22

Article Number

223101

Subjects

nanowires

•

piezoelectric devices

•

piezoelectric materials

•

piezoelectricity

•

potassium compounds

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LC  
Available on Infoscience
June 25, 2009
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/40893
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