Loading...
research article
Fabrication and characterization of a silicon cantilever probe with an integrated quartz-glass (fused-silica) tip for scanning near-field optical microscopy
2001
Use this identifier to reference this record
Type
research article
Authors
Schürmann, G.
•
•
Staufer, U.
•
•
Eckert, R.
•
Freyland, J. M.
•
Heinzelmann, H.
Publication date
2001
Published in
Volume
40
Issue
28
Start page
5040
End page
5045
Note
255
Peer reviewed
REVIEWED
EPFL units
Available on Infoscience
May 12, 2009