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  4. Measurement of quartz particles by means of an atomic force microscope for planetary exploration
 
research article

Measurement of quartz particles by means of an atomic force microscope for planetary exploration

Gautsch, S.  
•
Akiyama, T.  
•
Imer, R.
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2002
Surf. Interface Anal.

Within the last 2 years our consortium has developed, built and tested an atomic force microscope for planetary science applications, in particular for the study of Martian dust and soil. An array of eight cantilevers and tips provides redundancy in case of tip or cantilever failure. Images can be recorded in both static and dynamic operation modes. As we plan to investigate Martian dust, our interest focuses on the behaviour of the instrument when measuring loose particles in the above-mentioned modes. During scanning, tip contamination with a particle occurs quite frequently, altering the quality of the images. Before changing the cantilever, reverse-imaging the contaminated tip on a tip calibration sample will be performed in order to increase the scientific throughput. We present the results of our test measurements on respirable α-quartz.

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Type
research article
DOI
10.1002/sia.1182
Author(s)
Gautsch, S.  
Akiyama, T.  
Imer, R.
de Rooij, N. F.  
Staufer, U.
Niedermann, Ph.
Howald, L.
Brändlin, D.
Tonin, A.
Hidber, H.-R.
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Date Issued

2002

Published in
Surf. Interface Anal.
Volume

33

Start page

163

End page

167

Note

282

Editorial or Peer reviewed

REVIEWED

Written at

OTHER

EPFL units
SAMLAB  
Available on Infoscience
May 12, 2009
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/39278
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