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research article

Near-field optical microscopy based on microfabricated probes

Eckert, R.
•
Freyland, J. M.
•
Gersen, H.
Show more
2001
Journal of Microscopy

We demonstrate high resolution imaging with microfabricated, cantilevered probes, consisting of solid quartz tips on silicon levers. The tips are covered by a 60-nm thick layer of aluminium, which appears to be closed at the apex when investigated by transmission electron microscopy. An instrument specifically built for cantilever probes was used to record images of latex bead projection patterns in transmission as well as single molecule fluorescence. All images were recorded in constant height mode and show optical resolutions down to 32 nm.

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Type
research article
DOI
10.1046/j.1365-2818.2001.00880.x
Author(s)
Eckert, R.
Freyland, J. M.
Gersen, H.
Heinzelmann, H.
Schürmann, G.
Noell, W.  
Staufer, U.
de Rooij, N. F.  
Date Issued

2001

Published in
Journal of Microscopy
Volume

202

Issue

1

Start page

7

End page

11

Note

266

Editorial or Peer reviewed

REVIEWED

Written at

OTHER

EPFL units
SAMLAB  
Available on Infoscience
May 12, 2009
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/39230
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