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  4. Dielectric and electromechanical properties of ferroelectric-relaxor 0.9 Pb(Mg1/3Nb2/3)O-3-0.1PbTiO(3) thin films
 
research article

Dielectric and electromechanical properties of ferroelectric-relaxor 0.9 Pb(Mg1/3Nb2/3)O-3-0.1PbTiO(3) thin films

Kighelman, Z.  
•
Damjanovic, D.  
•
Setter, N.  
2001
Journal of Applied Physics

Pyrochlore free 0.9Pb(Mg1/3Nb2/3)O-3-0.1PbTiO(3) thin films were prepared from alkoxide-based solution precursors. Preferential (111) crystallographic orientation was obtained on TiO2/Pt/TiO2/SiO2/Si substrates by spin coating. Dielectric, electrostrictive, and piezoelectric properties of the films were characterized in detail. Films show relaxor-like behavior, but with dielectric permittivity which is low (around 4300 at peak and at 340 Hz with E-ac=1.6x10(6) V/m) compared to bulk ceramics and single crystals. Several parameters which might be responsible for this lower permittivity are suggested. The ac and dc field dependences of the dielectric response have been investigated. Electrostrictive coefficients, M-11(7.76x10(-18) m(2)/V-2) and Q(11)(1.9x10(-2) m(4) C-2), were determined by measuring strain and polarization as a function of the electric field (E-ac). The maximum field induced piezoelectric d(33) coefficient is 100 pm/V and electrostrictive strains up to 1.2x10(-3) (with an ac electric field of 140 kV/cm) were measured. (C) 2001 American Institute of Physics.

  • Details
  • Metrics
Type
research article
DOI
10.1063/1.1409573
Web of Science ID

WOS:000171594800054

Author(s)
Kighelman, Z.  
Damjanovic, D.  
Setter, N.  
Date Issued

2001

Published in
Journal of Applied Physics
Volume

90

Issue

9

Start page

4682

End page

4689

Subjects

lead magnesium niobate

•

single-crystals

•

piezoelectric behavior

•

phase-transition

•

electric-field

•

ceramics

•

temperature

•

deposition

•

domain

Note

Kighelman, Z Ecole Polytech Fed Lausanne, Swiss Fed Inst Technol, Dept Mat, Ceram Lab, CH-1015 Lausanne, Switzerland Ecole Polytech Fed Lausanne, Swiss Fed Inst Technol, Dept Mat, Ceram Lab, CH-1015 Lausanne, Switzerland

482UE

Cited References Count:54

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LC  
Available on Infoscience
August 21, 2006
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/233453
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