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  4. High Quality Factor Copper Inductors Integrated in Deep Dry Etched Quartz Substrates
 
conference paper

High Quality Factor Copper Inductors Integrated in Deep Dry Etched Quartz Substrates

Leroy, Christine
•
Pisani, Marcelo B.  
•
Hibert, Cyrille  
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2007
Microsystem Technologies
2006 Symposium on Design, Test, Integration and Packaging of MEMS / MOEMS, DTIP 2006
  • Details
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Type
conference paper
DOI
10.1007/s00542-006-0364-z
Author(s)
Leroy, Christine
Pisani, Marcelo B.  
Hibert, Cyrille  
Bouvet, Didier  
Puech, M.
Ionescu, Adrian M.  
Date Issued

2007

Published in
Microsystem Technologies
Volume

13

Issue

11-12

Start page

1483

End page

1487

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
NANOLAB  
CMI  
Event nameEvent placeEvent date
2006 Symposium on Design, Test, Integration and Packaging of MEMS / MOEMS, DTIP 2006

Stresa, Italy

April 2006

Available on Infoscience
May 10, 2006
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/230088
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