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research article

Correlation between optical properties and interfaces morphology of GaAs/AlGaAs quantum wells

Moret, N.  
•
Oberli, D.Y.  
•
Pelucchi, E.  
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2006
Applied Physics Letters

We investigate the embedded interfaces of GaAs/AlGaAs quantum wells grown by metal organic vapor phase epitaxy on slightly (< 1 degrees)-misoriented (001) substrates using selective etching and atomic force microscopy. Depending on the substrate misorientation, we observe different growth modes at the embedded interfaces, which are directly correlated to the photoluminescence linewidth. We show that the narrowest linewidth is obtained on 0.2 degrees-off (001) substrates for which the heterointerfaces consist of atomically smooth narrow terraces. We investigate the embedded interfaces of GaAs/AlGaAs quantum wells grown by metal organic vapor phase epitaxy on slightly (< 1 degrees)- misoriented (001) substrates using selective etching and atomic force microscopy. Depending on the substrate misorientation, we observe different growth modes at the embedded interfaces, which are directly correlated to the photoluminescence linewidth. We show that the narrowest linewidth is obtained on 0.2 degrees-off (001) substrates for which the heterointerfaces consist of atomically smooth narrow terraces. (c) 2006 American Institute of Physics.

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Type
research article
DOI
10.1063/1.2193039
Web of Science ID

WOS:000236612000032

Author(s)
Moret, N.  
Oberli, D.Y.  
Pelucchi, E.  
Gogneau, N.  
Rudra, A.  
Kapon, E.  
Date Issued

2006

Publisher

AIP American Institute of Physics

Published in
Applied Physics Letters
Volume

88

Article Number

141917

Subjects

Exciton Localization

•

Roughness

•

Photoluminescence

•

Heterostructures

•

Gaas

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LPN  
Available on Infoscience
February 29, 2008
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/19747
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