conference paper
Thermo-refractive noise in silicon nitride microresonators
January 1, 2019
2019 Conference On Lasers And Electro-Optics (Cleo)
Thermodynamic noises limit the frequency stability of resonators. Here, we present the first complete characterization of thermo-refractive noise in Si3N4 microresonators. The measurements are in good agreement with theoretical analysis and FEM simulation of the structures. (c) 2019 The Author(s)
Type
conference paper
Web of Science ID
WOS:000482226301068
Author(s)
Raja, Arslan S.
Lihachev, Grigory
Gorodetsky, Michael L.
Engelsen, Nils J.
Date Issued
2019-01-01
Publisher
Publisher place
New York
Published in
2019 Conference On Lasers And Electro-Optics (Cleo)
ISBN of the book
978-1-943580-57-6
Series title/Series vol.
Conference on Lasers and Electro-Optics
Editorial or Peer reviewed
REVIEWED
Written at
EPFL
EPFL units
| Event name | Event place | Event date |
San Jose, CA | May 05-10, 2019 | |
Available on Infoscience
September 11, 2019
Use this identifier to reference this record